Extended scale-invariant pattern recognition with white-light illumination

被引：6
|
作者：
Esteve-Taboada, JJ [1 ]
García, J [1 ]
Ferreira, C [1 ]
机构：
[1] Univ Valencia, Fac Fis, Dept Interuniv Opt, E-46100 Valencia, Spain
来源：
APPLIED OPTICS | 2000年 / 39卷 / 08期
关键词：
D O I：
10.1364/AO.39.001268
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A previous method of obtaining scale-invariance detection with white-light illumination has been improved on. We were able to detect different scaled versions of the target up to a magnification factor equal to 2. We simultaneously detected several versions in the same scene, because each Scale factor is codified in a different wavelength. Experimental results demonstrate the proposed technique and show the utility of the method. (C) 2000 Optical Society America.
引用
收藏
页码：1268 / 1271
页数：4
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