CO tip functionalization in subatomic resolution atomic force microscopy

被引:5
|
作者
Kim, Minjung [1 ]
Chelikowsky, James R. [2 ,3 ]
机构
[1] Univ Texas Austin, Dept Chem Engn, Austin, TX 78712 USA
[2] Univ Texas Austin, Inst Computat Engn & Sci, Ctr Computat Mat, Austin, TX 78712 USA
[3] Univ Texas Austin, Dept Phys & Chem Engn, Austin, TX 78712 USA
关键词
ELECTRONIC-STRUCTURE CALCULATIONS; CHEMICAL-STRUCTURE; IDENTIFICATION;
D O I
10.1063/1.4934273
中图分类号
O59 [应用物理学];
学科分类号
摘要
Noncontact atomic force microscopy (nc-AFM) employing a CO-functionalized tip displays dramatically enhanced resolution wherein covalent bonds of polycyclic aromatic hydrocarbon can be imaged. Employing real-space pseudopotential first-principles calculations, we examine the role of CO in functionalizing the nc-AFM tip. Our calculations allow us to simulate full AFM images and ascertain the enhancement mechanism of the CO molecule. We consider two approaches: one with an explicit inclusion of the CO molecule and one without. By comparing our simulations to existing experimental images, we ascribe the enhanced resolution of the CO functionalized tip to the special orbital characteristics of the CO molecule. (C) 2015 AIP Publishing LLC.
引用
收藏
页数:4
相关论文
共 50 条
  • [21] DYNAMICS OF TIP SUBSTRATE INTERACTIONS IN ATOMIC FORCE MICROSCOPY
    LANDMAN, U
    LUEDTKE, WD
    NITZAN, A
    SURFACE SCIENCE, 1989, 210 (03) : L177 - L184
  • [22] EFFECT OF THE TIP STRUCTURE ON ATOMIC-FORCE MICROSCOPY
    SASAKI, N
    TSUKADA, M
    PHYSICAL REVIEW B, 1995, 52 (11): : 8471 - 8482
  • [23] ATOMIC FORCE MICROSCOPY USING ZNO WHISKER TIP
    KADO, H
    YOKOYAMA, K
    TOHDA, T
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (06): : 3330 - 3332
  • [24] Contrast artifacts in tapping tip atomic force microscopy
    Department of Physics, Bldg. 307, Technical University of Denmark, DK-2800 Lyngby, Denmark
    Appl Phys A, SUPPL. 1 (S329-S332):
  • [25] Contrast artifacts in tapping tip atomic force microscopy
    A. Kühle
    A.H. Sorensen
    J.B. Zandbergen
    J. Bohr
    Applied Physics A, 1998, 66 : S329 - S332
  • [26] A NOVEL ZNO WHISKER TIP FOR ATOMIC FORCE MICROSCOPY
    KADO, H
    YOKOYAMA, K
    TOHDA, T
    ULTRAMICROSCOPY, 1992, 42 : 1659 - 1663
  • [27] Contrast artifacts in tapping tip atomic force microscopy
    Kuhle, A
    Sorensen, AH
    Zandbergen, JB
    Bohr, J
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S329 - S332
  • [28] Characterizing Atomic Force Microscopy Tip Shape in Use
    Wang, Chunmei
    Itoh, Hiroshi
    Sun, Jielin
    Hu, Jun
    Shen, Dianhong
    Ichimura, Shingo
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2009, 9 (02) : 803 - 808
  • [29] METHOD OF DETERMINING TIP STRUCTURE IN ATOMIC FORCE MICROSCOPY
    PAIK, SM
    KIM, S
    SCHULLER, IK
    PHYSICAL REVIEW B, 1991, 44 (07): : 3272 - 3276
  • [30] DIRECT OBSERVATION OF THE ATOMIC-FORCE MICROSCOPY TIP USING INVERSE ATOMIC-FORCE MICROSCOPY IMAGING
    MONTELIUS, L
    TEGENFELDT, JO
    VANHEEREN, P
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03): : 2222 - 2226