In-situ transmission electron microscopy study of ion-irradiated copper:: temperature dependence of defect yield and cascade collapse

被引:12
|
作者
Daulton, TL [1 ]
Kirk, MA [1 ]
Rehn, LE [1 ]
机构
[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
关键词
D O I
10.1080/01418610008212084
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High-energy neutrons and ions incident upon a solid can initiate displacement collision cascades of lattice atoms which result in localized volumes within the solid that contain high concentrations of interstitial and vacancy point defects. At sufficiently high point-defect concentrations, cascade regions are unstable; recombination of interstitial and vacancy point defects can occur together with the aggregation of point defects into clusters. These clusters can collapse into various types of dislocation loop and stacking-fault tetrahedra which are large enough to produce lattice strain fields that are visible under diffraction-contrast imaging in a transmission electron microscope. The kinetics which drive cascade formation and subsequent collapse are investigated by analysing the microstructure produced in situ by low-fluence 100 keV Kr-ion irradiations of fee Cu over a wide temperature range (18-873 K). The product microstructures are characterized by quantitative measurements of the yields of collapsed point-defect clusters. In addition, their stabilities, lifetimes and size distributions are also examined. Defect yields are demonstrated unequivocally to be temperature dependent, remaining approximately constant up to lattice temperatures of 573 K and then abruptly decreasing with increasing temperature. This drop in yield is not caused by defect loss during or following ion irradiation. It rather reflects a decrease in the probability of cascade collapse which can be explained by a thermal spike effect.
引用
收藏
页码:809 / 842
页数:34
相关论文
共 50 条
  • [41] Study of the order-disorder transition series in AuCu by in-situ temperature electron microscopy
    Bonneaux, J
    Guymont, M
    INTERMETALLICS, 1999, 7 (07) : 797 - 805
  • [42] Transmission electron microscopy assisted in-situ joule heat dissipation study of individual InAs nanowires
    Xu, T. T.
    Wei, X. L.
    Shu, J. P.
    Chen, Q.
    APPLIED PHYSICS LETTERS, 2013, 103 (19)
  • [43] In-situ annealing transmission electron microscopy study of Pd/Ge/Pd/GaAs interfacial reactions
    Radulescu, F
    McCarthy, JM
    Stach, EA
    ADVANCES IN MATERIALS PROBLEM SOLVING WITH THE ELECTRON MICROSCOPE, 2001, 589 : 179 - 184
  • [44] An In Situ transmission electron microscopy study on the synergistic effects of Au-ion irradiation and high temperature on nuclear graphite microstructure
    Thomas, Melonie P.
    Schoell, Ryan
    Rasel, Md Abu Jafar
    Rahman, Md Hafijur
    Kuo, Winson
    Watt, John
    House, Stephen
    Hattar, Khalid
    Windes, William
    Haque, Aman
    MATERIALS RESEARCH EXPRESS, 2024, 11 (04)
  • [45] An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe
    Edmondson, P. D.
    Abrams, K. J.
    Hinks, J. A.
    Greaves, G.
    Pawley, C. J.
    Hanif, I.
    Donnelly, S. E.
    SCRIPTA MATERIALIA, 2016, 113 : 190 - 193
  • [46] Electric and Mass Transport of a Carbon Nanotube Encapsulating a Copper Nano-Rod Studied by In-Situ Transmission Electron Microscopy
    Kimura, F.
    Asaka, K.
    Nakahara, H.
    Kokai, F.
    Saito, Y.
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2010, 10 (06) : 3907 - 3909
  • [47] In-situ transmission electron microscopy study of dislocation processes at precipitate-free zones in a γ′-strengthened superalloy
    Baither, D
    Krol, T
    Nembach, E
    PHILOSOPHICAL MAGAZINE, 2003, 83 (35) : 4011 - 4029
  • [48] Synergistic effects of heating and biasing of AlGaN/GaN high electron mobility transistors: An in-situ transmission electron microscopy study
    Al-Mamun, Nahid Sultan
    Islam, Ahmad
    Glavin, Nicholas
    Haque, Aman
    Wolfe, Douglas E.
    Ren, Fan
    Pearton, Stephen
    MICROELECTRONICS RELIABILITY, 2024, 160
  • [49] In-situ transmission electron microscopy and first-principles study of Au (100) surface dislocation dynamics
    Song, B.
    Jansen, J.
    Tichelaar, F. D.
    Zandbergen, H. W.
    Gajewski, G.
    Pao, C. W.
    Srolovitz, D. J.
    SURFACE SCIENCE, 2013, 608 : 154 - 164
  • [50] In-situ transmission electron microscopy study of the dislocation accommodation in [101] tilt grain boundaries in nickel bicrystals
    Poulat, S
    Décamps, B
    Priester, L
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1999, 79 (11): : 2655 - 2680