Mid-Infrared Sensing Using Heavily Doped Germanium Plasmonics on Silicon Substrates

被引:0
|
作者
Baldassarre, L. [1 ]
Sakat, E. [2 ]
Frigerio, J. [3 ]
Frigerio, J. B. J. [2 ]
Samarelli, A. [4 ]
Giliberti, V [3 ]
Pellegrini, G. [2 ]
Gallacher, K. [4 ]
Fischer, M. [5 ,6 ]
Brida, D. [5 ,6 ]
Isella, G. [3 ]
Biagioni, P. [2 ]
Paul, D. J. [4 ]
Ortolani, M. [1 ]
机构
[1] Ist Italiano Tecnol, Ctr Life NanoSci Sapienza, Viale Regina Elena 291, I-00161 Rome, Italy
[2] Politecn Milan, Dipartimento Fis, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy
[3] Politecn Milan, Dipartimento Fis, L NESS, Polo Terr Como, Via Anzani 42, I-22100 Como, Italy
[4] Univ Glasgow, Sch Engn, Rankine Bldg,Oakfield Ave, Glasgow G12 8LT, Lanark, Scotland
[5] Univ Konstanz, Dept Phys, D-78457 Constance, Germany
[6] Univ Konstanz, Ctr Appl Photon, D-78457 Constance, Germany
关键词
SI; FABRICATION; ANTENNAS;
D O I
10.1149/07508.0247ecst
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Heavily-doped semiconductor films are very promising to produce mid-infrared plasmonic devices for a wide range of sensing applications because the real part of the dielectric function of the film is negative and broadly tunable in this wavelength range. In this work, we investigate, n-type doped Ge epilayers grown on Si substrates. We design and realize Ge nano-antennas on Si substrates demonstrating the presence of localized plasmon resonances, and exploit these resonances for molecular sensing in the mid-infrared.
引用
收藏
页码:247 / 251
页数:5
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