X-ray diffraction radiation in conditions of Cherenkov effect

被引：10
|
作者：
Tishchenko, A. A.
Potylitsyn, A. P.
Strikhanov, M. N.
机构：
[1] State Univ, Moscow Phys Engn Inst, Moscow 115409, Russia
[2] Tomsk Polytech Univ, Tomsk 634050, Russia
来源：
PHYSICS LETTERS A | 2006年 / 359卷 / 05期
关键词：
X-ray Cherenkov radiation; diffraction radiation; absorption edge; TRANSITION RADIATION; CERENKOV RADIATION; GRAZING-INCIDENCE; NARROW-BAND; ELECTRONS; PHOTOABSORPTION; EMISSION; EDGE;
D O I：
10.1016/j.physleta.2006.06.066
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
X-ray diffraction radiation from ultra-relativistic electrons moving near an absorbing target is considered. The emission yield is found to increase significantly in conditions of Cherenkov effect. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码：509 / 511
页数：3
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