Carrier transport properties of organic materials for EL device operation

被引:220
|
作者
Naka, S
Okada, H
Onnagawa, H
Yamaguchi, Y
Tsutsui, T
机构
[1] Toyama Univ, Dept Elect & Elect Engn, Toyama 9308555, Japan
[2] Japan Sci & Technol Cooperat, CREST, Tsutsui Team, JST,ASTEC, Fukuoka 8168580, Japan
[3] Kyushu Univ, Grad Sch Engn Sci, Dept Appl Sci Elect & Mat, Kasuga, Fukuoka 8168580, Japan
关键词
mobility; time-of-flight; carrier transport;
D O I
10.1016/S0379-6779(99)00358-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have measured drift mobilities in vacuum deposited films of tris(8-quinolinolato)aluminum (Alq(3)), a triphenylamine derivative (TPD) and a naphtyl-substituted benzidine derivative (alpha-NPD) using a time-of-flight (TOF) technique. The hole mobilities of TPD and alpha-NPD are about two orders of magnitude higher than the electron mobility of Alq(3). This implies that the current density versus applied voltage characteristics is dominated by the electron mobility of Alq(3) rather than the hole mobility of TPD or alpha-NPD in double-layered devices ITO/TPD or alpha-NPD (50 nm)/Alq(3) (50 nm)/MgAg. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:331 / 333
页数:3
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