Transient surface photovoltage measurement over 12 orders of magnitude in time

被引：11
|
作者：
Dittrich, Thomas [1 ]
Fengler, Steffen [2 ]
Franke, Michael [3 ]
机构：
[1] Helmholtz Zentrum Berlin Mat & Energie GmbH, Inst Silizium Photovolta, Kekulestr 5, D-12489 Berlin, Germany
[2] Helmut Schmidt Univ, Inst Werkstofftech, Holstenhofweg 85, D-22043 Hamburg, Germany
[3] Elekt Mfg Mahlsdorf, Paul Wegener Str 36, D-12623 Berlin, Germany
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2017年 / 88卷 / 05期
关键词：
KELVIN PROBE; SPECTROSCOPY; SILICON; STATES;
D O I：
10.1063/1.4983079
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The measurement of transient surface photovoltage (SPV) signals in a fixed capacitor arrangement over 12 orders of magnitude in time has been demonstrated for a SnO2:F/TiO2/In2S3 layer system under high vacuum. For this purpose, a high impedance buffer with a bandwidth above 200 MHz and an effective input resistance of 200-700 T Omega has been developed. Fast separation of photo generated charge carriers within ns and very slow relaxation of SPV signals excited with short laser pulses and the measurement of SPV spectra under continuous illumination with a halogen lamp were demonstrated. Published by AIP Publishing.
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收藏
页数：7
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