Omnidirectional and Broadband Antireflection Effect with Tapered Silicon Nanostructures Fabricated with Low-Cost and Large-Area Capable Nanosphere Lithography

被引:8
|
作者
Kim, Sangho [1 ]
Jeong, Gwan Seung [2 ]
Park, Na Yeon [2 ]
Choi, Jea-Young [1 ]
机构
[1] Dong A Univ, Dept Mat Sci & Engn, Busan 604714, South Korea
[2] Dong A Univ, Dept Met Engn, Busan 604714, South Korea
基金
新加坡国家研究基金会;
关键词
nanostructure; gradient refractive index change; antireflection; spin-coating; solar cell;
D O I
10.3390/mi12020119
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
In this report, we present a process for the fabrication and tapering of a silicon (Si) nanopillar (NP) array on a large Si surface area wafer (2-inch diameter) to provide enhanced light harvesting for Si solar cell application. From our N,N-dimethyl-formamide (DMF) solvent-controlled spin-coating method, silica nanosphere (SNS in 310 nm diameter) coating on the Si surface was demonstrated successfully with improved monolayer coverage (>95%) and uniformity. After combining this method with a reactive ion etching (RIE) technique, a high-density Si NP array was produced, and we revealed that controlled tapering of Si NPs could be achieved after introducing a two-step RIE process using (1) CHF3/Ar gases for SNS selective etching over Si and (2) Cl-2 gas for Si vertical etching. From our experimental and computational study, we show that an effectively tapered Si NP (i.e., an Si nanotip (NT)) structure could offer a highly effective omnidirectional and broadband antireflection effect for high-efficiency Si solar cell application.
引用
收藏
页码:1 / 11
页数:11
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