Analysis of the healthy rabbit lens surface using MAC mode atomic force microscopy

被引:2
|
作者
Antunes, A.
Gozzo, F. V.
Nakamura, M.
Safatle, A. M. V.
Morelhao, S. L.
Toma, H. E.
Barros, P. S. M.
机构
[1] Univ Sao Paulo, Fac Med Vet & Zootecn, Dept Cirurgia, Lab Expt Oftalmol Comparada, BR-05508900 Sao Paulo, Brazil
[2] Univ Sao Paulo, Inst Quim, Lab Supramol & Nanotecnol, Sao Paulo, SP, Brazil
[3] Univ Sao Paulo, Inst Fis, Dept Fis Aplicada, Sao Paulo, SP, Brazil
关键词
atomic force microscopy; Mac Mode SPM; morphology; crystalline lens; fibers; rabbit;
D O I
10.1016/j.micron.2006.04.006
中图分类号
TH742 [显微镜];
学科分类号
摘要
In this investigation healthy rabbit crystalline lenses were characterized by atomic force microscopy (AFM). The lenses were cut in slices with thickness with 1 mm and thus, put after cortex distinct regions of nucleus and cortex for AFM examination. AFM analysis were carried out using a PicoSPM I operating in Mac Mode. We obtained topographic images of rabbit lenses and a quantitative analysis of the width and height of fibers for nucleus and cortex regions. The longitudinal section analysis of fibers in the nucleus region indicated structures with an average width of 200 nm and average height of 200 nm. The intershells distance was determined as 4 mu m. Fiber cell cross-section dimensions, longitudinal and transverse widths, could be estimated in these regions from the AFM images. Structures with average widths as small as 1.0 mu m are observed in the nucleus; the intershell distance is 4.0 mu m. In cortical regions, hexagonal structures with average longitudinal and transverse widths of 5.0 mu m and 3.0 mu m, respectively, were identified. Three-dimensional images of tissue sections with resolution on a nanometer scale were obtained. The potential of AFM analysis for characterizing healthy and pathologic lens tissues is discussed. (c) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:286 / 290
页数:5
相关论文
共 50 条
  • [21] Using the dissipation mode in high resolution atomic force microscopy
    Temiryazev A.G.
    Kraev A.V.
    Saunin S.A.
    Temiryazev, A.G., 1600, Izdatel'stvo Nauka (08): : 926 - 931
  • [22] Dentine surface structure investigated with tapping mode atomic force microscopy
    Silikas, N
    Watts, DC
    England, KER
    Jandt, KD
    JOURNAL OF DENTAL RESEARCH, 1998, 77 : 810 - 810
  • [23] Tapping mode atomic force microscopy of surface morphology of polymer blends
    Li, Jing
    Liang, Wenbin
    Meyers, Gregory F.
    Heeschen, William A.
    Polymer News, 2004, 29 (11): : 335 - 345
  • [24] Primate lens capsule elasticity assessed using Atomic Force Microscopy
    Ziebarth, Noel M.
    Arrieta, Esdras
    Feuer, William J.
    Moy, Vincent T.
    Manns, Fabrice
    Parel, Jean-Marie
    EXPERIMENTAL EYE RESEARCH, 2011, 92 (06) : 490 - 494
  • [25] Atomic force microscopy study of intraocular lens implants - Topography and surface properties
    Kowalewski, T
    Ravi, VN
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1997, 213 : 72 - PMSE
  • [26] Assessing Mouse Lens Elasticity and Viscoelasticity Using Atomic Force Microscopy
    Batchelor, Wyndham More
    Arrieta, Esdras
    Ruggeri, Marco
    Parel, Jean-Marie A.
    Manns, Fabrice
    Dibas, Mohammed
    Ziebarth, Noel Marysa
    INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE, 2018, 59 (09)
  • [27] Atomic force microscopy analysis of the effect of plasma treatment on gas permeable contact lens surface topography
    Gill, Felicity R.
    Purslow, Christine
    Murphy, Paul J.
    CONTACT LENS & ANTERIOR EYE, 2019, 42 (03): : 265 - 272
  • [28] Surface force between particles studied using atomic force microscopy
    Xing, Yaowen
    Liu, Min
    Gui, Xiahui
    Cao, Yijun
    Gao, Zhiyong
    Sun, Wei
    Zhongguo Kuangye Daxue Xuebao/Journal of China University of Mining and Technology, 2019, 48 (06): : 1352 - 1357
  • [29] Imaging for uniformity of lithium metal surface using tapping mode-atomic force and surface potential microscopy
    Shiraishi, S
    Kanamura, K
    Takehara, Z
    JOURNAL OF PHYSICAL CHEMISTRY B, 2001, 105 (01): : 123 - 134
  • [30] Characterization of heterogeneous regions in polymer systems using tapping mode and force mode atomic force microscopy
    Raghavan, D
    VanLandingham, M
    Gu, X
    Nguyen, T
    LANGMUIR, 2000, 16 (24) : 9448 - 9459