Size-effects on the optical properties of zirconium oxide thin films

被引:39
|
作者
Ramana, C. V. [1 ]
Vemuri, R. S. [1 ]
Fernandez, I. [1 ]
Campbell, A. L. [2 ]
机构
[1] Univ Texas El Paso, Dept Mech Engn, El Paso, TX 79968 USA
[2] Mat & Mfg Directorate RX, Wright Patterson AFB, OH 45433 USA
关键词
GATE DIELECTRICS; ZRO2; LAYERS;
D O I
10.1063/1.3271697
中图分类号
O59 [应用物理学];
学科分类号
摘要
Zirconium oxide (ZrO2) thin films with an average crystallite-size (L) ranging from 5 to 25 nm were grown by sputter deposition onto optical grade quartz substrates. The optical properties of grown ZrO2 films were evaluated using optical transmission and reflectance spectroscopic measurements. The size-effects were significant on the optical characteristics of ZrO2 films. The bandgap energy (E-g) was found to increase from 5.78 to 6.07 eV with decreasing L values from 20 to 7 nm. A direct, linear inverse L-E-g relationship found for ZrO2 films suggest that tuning optical properties for desired applications can be achieved by controlling the size. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3271697]
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页数:3
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