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- [1] Sub-microsecond Adaptive Voltage Scaling in a 28nm FD-SOI Processor SoCESSCIRC CONFERENCE 2016, 2016, : 269 - 272Keller, Ben论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USACochet, Martin论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA STMicroelectronics, Crolles, France Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAZimmer, Brian论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USALee, Yunsup论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USABlagojevic, Milovan论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA STMicroelectronics, Crolles, France Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAKwak, Jaehwa论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAPuggelli, Alberto论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USABailey, Stevo论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAChiu, Pi-Feng论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USADabbelt, Palmer论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USASchmidt, Colin论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAAlon, Elad论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAAsanovic, Krste论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USANikolic, Borivoje论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
- [2] A RISC-V Processor SoC With Integrated Power Management at Submicrosecond Timescales in 28 nm FD-SOIIEEE JOURNAL OF SOLID-STATE CIRCUITS, 2017, 52 (07) : 1863 - 1875Keller, Ben论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USACochet, Martin论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA STMicroelectronics, F-38920 Crolles, France Aix Marseille Univ, F-13284 Marseille, France CNRS, IM2NP, UMR 7334, F-13284 Marseille, France Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAZimmer, Brian论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA NVIDIA, Circuits Res Grp, Santa Clara, CA 95050 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAKwak, Jaehwa论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAPuggelli, Alberto论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Lion Semicond Inc, Technol, San Francisco, CA 94107 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USALee, Yunsup论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA SiFive Inc, San Francisco, CA 94107 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USABlagojevic, Milovan论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA STMicroelectronics, F-38920 Crolles, France Intel Deutschland GmbH, D-85579 Neubiberg, Germany Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USABailey, Stevo论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAChiu, Pi-Feng论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USADabbelt, Palmer论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USASchmidt, Colin论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAAlon, Elad论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAAsanovic, Krste论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USANikolic, Borivoje论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
- [3] Total dose effects of 28nm FD-SOI CMOS transistors2018 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S), 2018,Kuang, Yong论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Key Lab Silicon Device Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R ChinaBu, Jianhui论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Key Lab Silicon Device Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R ChinaLi, Bo论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Key Lab Silicon Device Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R ChinaGao, Linchun论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Key Lab Silicon Device Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R ChinaLiang, Chunping论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Key Lab Silicon Device Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R ChinaHan, Zhengsheng论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Key Lab Silicon Device Technol, Beijing 100029, Peoples R China Univ Chinese Acad Sci, Beijing 100049, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R ChinaLuo, Jiajun论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China Chinese Acad Sci, Key Lab Silicon Device Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
- [4] Evaluation of Dual Mode Logic in 28nm FD-SOI Technology2017 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2017, : 2775 - 2778Taco, Ramiro论文数: 0 引用数: 0 h-index: 0机构: Univ Calabria, Arcavacata Di Rende, CS, Italy Univ Calabria, Arcavacata Di Rende, CS, Italy论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构:Fish, Alexander论文数: 0 引用数: 0 h-index: 0机构: Bar Ilan Univ, Ramat Gan, Israel Univ Calabria, Arcavacata Di Rende, CS, Italy
- [5] Statistical Analysis of Dynamic Variability in 28nm FD-SOI MOSFETsPROCEEDINGS OF THE 2014 44TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2014), 2014, : 214 - 217Ioannidis, E. G.论文数: 0 引用数: 0 h-index: 0机构: INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, France STMicroelectronics, F-38921 Crolles, France INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, FranceHaendler, S.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, F-38921 Crolles, France INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, FranceTheodorou, C. G.论文数: 0 引用数: 0 h-index: 0机构: INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, France INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, FrancePlanes, N.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, F-38921 Crolles, France INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, FranceDimitriadis, C. A.论文数: 0 引用数: 0 h-index: 0机构: Aristotle Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, FranceGhibaudo, G.论文数: 0 引用数: 0 h-index: 0机构: INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, France INPG, MINATEC, IMEP LAHC, F-38016 Grenoble, France
- [6] Synopsys, STMicroelectronics and Samsung to collaborate on adoption of 28nm FD-SOISOLID STATE TECHNOLOGY, 2014, 57 (04) : 10 - 11不详论文数: 0 引用数: 0 h-index: 0
- [7] Silicon thickness monitoring strategy for FD-SOI 28nm technologyPROCEEDINGS OF THE 2015 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS 2015), 2015, : 65 - 69Cros, Antoine论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, France STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, FranceMonsieur, Frederic论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, France STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, FranceCarminati, Yann论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, France STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, FranceNormandon, Philippe论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, France STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, FrancePetit, David论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, France STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, FranceArnaud, Franck论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, France STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, FranceRosa, Julien论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, France STMicroelectronics, Crolles Site, TR&D STD TPS SiRel, 850 Rue Jean Monnet, F-38926 Crolles, France
- [8] A Dual-Core RISC-V Vector Processor With On-Chip Fine-Grain Power Management in 28-nm FD-SOIIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2020, 28 (12) : 2721 - 2725Wright, John Charles论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USASchmidt, Colin论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USABen Keller论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USADabbelt, Daniel Palmer论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAKwak, Jaehwa论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAIyer, Vighnesh论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAMehta, Nandish论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAChiu, Pi-Feng论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USABailey, Stevo论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USAAsanovic, Krste论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USANikolic, Borivoje论文数: 0 引用数: 0 h-index: 0机构: Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
- [9] A self-referenced on-chip jitter BIST with subpicosecond resolution in 28 nm FD-SOI technologyPROCEEDINGS OF THE 2022 IFIP/IEEE 30TH INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION (VLSI-SOC), 2022,Madhvaraj, Manasa论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CNRS, TIMA, Grenoble, France Univ Grenoble Alpes, CNRS, TIMA, Grenoble, FranceMir, Salvador论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CNRS, TIMA, Grenoble, France Univ Grenoble Alpes, CNRS, TIMA, Grenoble, FranceBarragan, Manuel J.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CNRS, TIMA, Grenoble, France Univ Grenoble Alpes, CNRS, TIMA, Grenoble, France
- [10] Embedded PCM macro for automotive-grade microcontroller in 28nm FD-SOI2019 SYMPOSIUM ON VLSI CIRCUITS, 2019, : C204 - C205Disegni, F.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilAnnunziata, R.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilMolgora, A.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilCampardo, G.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilCappelletti, P.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilZuliani, P.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilFerreira, P.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, BrazilVentre, A.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilCastagna, G.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Palermo, Italy STMicroelectronics, Agrate, BrazilCathelin, A.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles, Brazil STMicroelectronics, Agrate, BrazilGandolfo, A.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilGoller, F.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilMalhi, S.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Greater Noida, France STMicroelectronics, Agrate, BrazilManfre, D.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilMaurelli, A.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilTorti, C.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilArnaud, F.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Crolles, Brazil STMicroelectronics, Agrate, BrazilCarfi, M.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Catania, Italy STMicroelectronics, Agrate, BrazilPerroni, M.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Palermo, Italy STMicroelectronics, Agrate, BrazilCaruso, M.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Catania, Italy STMicroelectronics, Agrate, BrazilPezzini, S.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, BrazilPiazza, G.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Palermo, Italy STMicroelectronics, Agrate, BrazilWeber, O.论文数: 0 引用数: 0 h-index: 0机构: CEA LETI, Crolles, France STMicroelectronics, Agrate, BrazilPeri, M.论文数: 0 引用数: 0 h-index: 0机构: STMicroelectronics, Agrate, Brazil STMicroelectronics, Agrate, Brazil