Structure and growth of self-assembled thin-film materials probed by X-ray scattering.

被引：0
|
作者：
Salditt, T [1 ]
Vix, A [1 ]
An, QR [1 ]
Plech, A [1 ]
Eschbaumer, C [1 ]
Weidl, C [1 ]
Schubert, U [1 ]
机构：
[1] Univ Munich, Ctr Nanosci, D-80539 Munich, Germany
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2000年 / 219卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
299-COLL
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页码：U557 / U557
页数：1
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