Correction for background and sensitivity threshold in quantitative X-ray phase analysis

被引：1

作者：

Golovkin, BG ^{[1
]}

机构：

[1] Russian Acad Sci, Inst Solid State Chem, Ural Div, Ekaterinburg 620219, Russia

来源：

JOURNAL OF ANALYTICAL CHEMISTRY | 2002年 / 57卷 / 11期

关键词：

Analytical Chemistry; Phase Analysis; Minimum Concentration; Sensitivity Threshold; Simultaneous Correction;

D O I：

10.1023/A:1020921322805

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A procedure was proposed for the simultaneous correction of the background and sensitivity thresholds of the phases to be determined. The procedure provides the estimation of the minimum concentrations of phases in mixtures that can be detected by an X-ray diffraction technique.

引用

页码：1006 / 1008

页数：3

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