Magnetotransport and micro-x-ray absorption near-edge structure studies of glass-coated Fe-Ni-Cu microwires

被引:1
|
作者
Wang, KY [1 ]
Tang, JK
Schilling, PJ
Moelders, N
机构
[1] Univ New Orleans, Adv Mat Res Inst, New Orleans, LA 70148 USA
[2] Univ New Orleans, Dept Mech Engn, New Orleans, LA 70148 USA
[3] Louisiana State Univ, J Bennett Johnston Sr Ctr Adv Microstruct & Devic, Baton Rouge, LA 70803 USA
关键词
D O I
10.1063/1.373177
中图分类号
O59 [应用物理学];
学科分类号
摘要
Magnetotransport and micro-x-ray absorption near-edge structure (micro-XANES) studies of glass-coated 20Fe-20Ni-60Cu microwires have been carried out on both as-cast and heat-treated samples. The micro-XANES spectroscopy data were collected at the K edges of Cu, Ni, and Fe with the x-ray microprobe beamline at the Center for Advanced Microstructures and Devices. Comparison of the Fe K-edge spectra from the microwires to standard spectra reveals that the Fe atoms in the as-cast sample are in a face-centered cubic (fcc) configuration and they remain in the fcc phase throughout the annealing processes. Giant magnetoresistance (GMR) has been observed in the microwires and it reaches similar to 6.5% at 300 K in a field of 9 T. The MR decreases to similar to 2.5% as the annealing temperature increases to 500 degrees C. The loss of GMR upon annealing is attributed to the growth of Fe-Ni rich magnetic particles. Significant reduction in the number of extremely small particles is obtained after annealing at 500 degrees C, which shows MR characteristics that are different from the as-cast and 300 degrees C annealed microwires. (C) 2000 American Institute of Physics. [S0021-8979(00)57708-1].
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页码:4843 / 4845
页数:3
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