Electronic Vector-Network-Analyzer Verification

被引：4
|
作者：
Williams, Dylan [1 ]
Lewandowski, Arkadiusz [1 ]
LeGolvan, Denis [1 ]
Ginley, Ron [1 ]
机构：
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
来源：
IEEE MICROWAVE MAGAZINE | 2009年 / 10卷 / 06期
关键词：
IMPEDANCE MEASUREMENT;
D O I：
10.1109/MMM.2009.933595
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
[No abstract available]
引用
收藏
页码：118 / 123
页数：5
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