Electronic Vector-Network-Analyzer Verification

被引：4
|
作者：
Williams, Dylan [1 ]
Lewandowski, Arkadiusz [1 ]
LeGolvan, Denis [1 ]
Ginley, Ron [1 ]
机构：
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
来源：
IEEE MICROWAVE MAGAZINE | 2009年 / 10卷 / 06期
关键词：
IMPEDANCE MEASUREMENT;
D O I：
10.1109/MMM.2009.933595
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
[No abstract available]
引用
收藏
页码：118 / 123
页数：5
相关论文
共 50 条
  • [1] An optimal vector-network-analyzer calibration algorithm
    Williams, DF
    Wang, JCM
    Arz, U
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (12) : 2391 - 2401
  • [2] Traceability and Calibration Techniques for Vector-Network-Analyzer
    Fezai, Nadia
    Ben Amor, Abdessattar
    2018 INTERNATIONAL CONFERENCE ON ADVANCED SYSTEMS AND ELECTRICAL TECHNOLOGIES (IC_ASET), 2017, : 113 - 117
  • [3] Electronic Calibration Unit for DC-8 GHz Vector-Network-Analyzer Measurements
    Abramowicz, Michal
    Lewandowski, Arkadiusz
    2016 21ST INTERNATIONAL CONFERENCE ON MICROWAVE, RADAR AND WIRELESS COMMUNICATIONS (MIKON), 2016,
  • [4] On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures
    Wei, Elyse Mcentee
    Chamberlin, Richard A.
    Kilmer, Nate
    Kast, Joshua
    Connors, Jake A.
    Williams, Dylan
    IEEE JOURNAL OF MICROWAVES, 2023, 3 (02): : 587 - 598
  • [5] Wideband extraction of soil dielectric spectrum from vector-network-analyzer measurements
    Lewandowski, Arkadiusz
    Szyplowska, Agnieszka
    Kafarski, Marcin
    Wilczek, Andrzej
    Szerement, Justyna
    Barmuta, Pawel
    Skierucha, Wojciech
    2017 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS (IMWS-AMP), 2017,
  • [6] Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements
    Lewandowski, Arkadiusz
    Wiatr, Wojciech
    Williams, Dylan
    40TH EUROPEAN MICROWAVE CONFERENCE, 2010, : 260 - 263
  • [7] Offset-Short Vector-Network-Analyzer Calibration with Simultaneous Modeling of Calibration Standards
    Lewandowski, Arkadiusz
    Wiatr, Wojciech
    Barmuta, Pawel
    2014 84TH ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG), 2014,
  • [8] Reconfigurable Waveguide for Vector Network Analyzer Verification
    Papantonis, Stergios
    Ridler, Nick M.
    Wilson, Alan
    Lucyszyn, Stepan
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2014, 62 (10) : 2415 - 2422
  • [9] 500 GHz-750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations
    Williams, Dylan F.
    IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, 2011, 1 (02) : 364 - 377
  • [10] Three-Port Vector-Network-Analyzer Calibrations using the NIST Microwave Uncertainty Framework
    Jargon, Jeffrey A.
    Williams, Dylan F.
    Sanders, Aric
    2019 92ND ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG), 2019,
12345