Formation of nitride thin films by electrochemical implantation

被引:0
|
作者
Goto, T [1 ]
Ito, Y [1 ]
机构
[1] Kyoto Univ, Dept Fundamental Energy Sci, Kyoto 6068501, Japan
来源
MOLTEN SALTS XII, PROCEEDINGS | 2000年 / 99卷 / 41期
关键词
D O I
暂无
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
Formation of iron nitride films by electrochemical implantation has been investigated in LiCl-KCl-Li3N systems. Electrochemical formation of iron nitride thin films has been achieved according to the following manner. When an iron electrode is anodically polarized in an LiCl-KCl eutectic melt at 450 degrees C in which Li3N is dissolved, the electrochemical. implantation proceeds according to the reaction steps; N3- = N-ads + 3e xN + Fe = FeNx Anodically produced nitrogen atoms react with the outermost surface of electrode and diffuse into bulk of iron electrode to form iron nitride thin film. The main phase of obtained nitride layer was found to be an fcc-structured gamma'-Fe4N from XRD analysis. From XPS and EPMA results, it was confirmed that the nitride film consisted of an epsilon-Fe2N1-x layer with concentration gradient, a homogeneous gamma'-Fe4N layer and an alpha-Fe layer. It was shown that nitrogen concentration in the film and its thickness were controlled by changing the applied potential. It has turned out that Similar process was applicable to the electrochemical formation of cobalt nitride, aluminum nitride and Fe-Sm-N ternary nitride films.
引用
收藏
页码:651 / 659
页数:9
相关论文
共 50 条
  • [41] Phase formation, thermal stability and magnetic moment of cobalt nitride thin films
    Gupta, Rachana
    Pandey, Nidhi
    Tayal, Akhil
    Gupta, Mukul
    AIP ADVANCES, 2015, 5 (09):
  • [42] The effect of plasma immersion ion implantation on the contact pressure and composition of titanium nitride thin films
    Lim, S. H. N.
    McCulloch, D. G.
    Bilek, M. M. M.
    McKenzie, D. R.
    du Plessis, J.
    Swain, M. V.
    Wuhrer, R.
    SURFACE & COATINGS TECHNOLOGY, 2006, 201 (1-2): : 396 - 400
  • [43] Dynamic scaling behavior of iron nitride thin films prepared by magnetron sputtering and ion implantation
    Li, WL
    Sun, Y
    Fei, WD
    TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA, 2005, 15 : 236 - 239
  • [44] Xenon implantation effects on the structural and optical properties of reactively sputtered titanium nitride thin films
    Popovic, M.
    Novakovic, M.
    Mitric, M.
    Zhang, K.
    Rakocevic, Z.
    Bibic, N.
    MATERIALS RESEARCH BULLETIN, 2017, 91 : 36 - 41
  • [45] Influence of implantation dose on electroluminescence from Si-implanted silicon nitride thin films
    Z. H. Cen
    T. P. Chen
    L. Ding
    Z. Liu
    J. I. Wong
    M. Yang
    W. P. Goh
    S. Fung
    Applied Physics A, 2011, 104 : 239 - 245
  • [46] Carbon nitride films prepared by ion implantation
    Gu, YS
    Pan, LQ
    Chang, XR
    Tian, ZZ
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1996, 15 (15) : 1355 - 1357
  • [47] Effect of Optical Radiation in Local Formation of Thin Films by an Electrochemical Method
    Khmyl, A. A.
    Fedosenko, N. N.
    Emel'yanov, V. A.
    Sholokh, V. G.
    Journal of Applied Spectroscopy, 1996, 63 (03)
  • [48] Influence of selenous acid microadditive on electrochemical formation of CdS thin films
    Maricheva, Jelena
    Bereznev, Sergei
    Maticiuc, Natalia
    Volobujeva, Olga
    Kois, Julia
    ELECTROCHIMICA ACTA, 2017, 242 : 280 - 286
  • [49] X-ray photoelectron spectroscopic observation on the formation of carbon nitride thin films produced by low-energy nitrogen ion implantation
    Japan Atom. Ener. Research Institute, Naka-gun, Ibaraki 319-1195, Japan
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (7 B): : 4540 - 4544
  • [50] Formation of HgSe thin films using electrochemical atomic layer epitaxy
    Mathe, MK
    Cox, SM
    Venkatasamy, V
    Happek, U
    Stickney, JL
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2005, 152 (11) : C751 - C755