Test sequence generation for controller verification and test with high coverage

被引:3
|
作者
Goren, Sezer [1 ]
Ferguson, F. Joel
机构
[1] Bahcesehir Univ, Dept Comp Engn, TR-34349 Istanbul, Turkey
[2] Univ Calif Santa Cruz, Dept Comp Engn, Santa Cruz, CA 95064 USA
关键词
algorithms; reliability; verification; fault coverage; black box testing; finite state machine; X-machine;
D O I
10.1145/1179461.1179467
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Verification and test are critical phases in the development of any hardware or software system. This article focuses on black box testing of the control part of hardware and software systems. Black box testing involves specification, test generation, and fault coverage. Finite state machines (FSMs) are commonly used for specifying controllers. FSMs may have shortcomings in modeling complex systems. With the introduction of X-machines, complex systems can be modeled at higher levels of abstraction. An X-machine can be converted into an FSM while preserving the level of abstraction. The fault coverage of a test sequence for an FSM specification provides a confidence level. We propose a fault coverage metric for an FSM specification based on the transition fault model, and using this metric, we derive the coverage of a test sequence. The article also presents a method which generates short test sequences that meet a specific coverage level and then extends this metric to determine the coverage of a test sequence for an FSM driven by an FSM network. We applied our FSM verification technique to a real-life FSM, namely, the fibre channel arbitrated loop port state machine, used in the field of storage area networks.
引用
收藏
页码:916 / 938
页数:23
相关论文
共 50 条
  • [21] AUTOMATIC TEST SEQUENCE GENERATION
    SALZMANN, CH
    IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1977, 13 (02) : 223 - 223
  • [22] High-Level Decision Diagrams based Coverage Metrics for Verification and Test
    Jenihhin, Maksim
    Raik, Jaan
    Chepurov, Anton
    Reinsalu, Uljana
    Ubar, Raimund
    LATW: 2009 10TH LATIN AMERICAN TEST WORKSHOP, 2009, : 49 - 54
  • [23] Layout-Based Test Coverage Verification for High-Reliability Devices
    Nagamura, Yoshikazu
    Shiozawa, Kenji
    Koyama, Toru
    Matsushima, Jun
    Tomonaga, Kazuhiro
    Hoshi, Yutaka
    Nomura, Shuji
    Arai, Masayuki
    Iwasaki, Kazuhiko
    INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING (ISSM) 2016 PROCEEDINGS OF TECHNICAL PAPERS, 2016,
  • [24] Layout-Based Test Coverage Verification for High-Reliability Devices
    Nagamura, Yoshikazu
    Shiozawa, Kenji
    Koyama, Toru
    Matsushima, Jun
    Tomonaga, Kazuhiro
    Hoshi, Yutaka
    Nomura, Shuji
    Arai, Masayuki
    Iwasaki, Kazuhiko
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2017, 30 (04) : 317 - 322
  • [25] Verification and test generation for the SSCOP protocol
    Bozga, M
    Fernandez, JC
    Ghirvu, L
    Jard, C
    Jéron, T
    Kerbrat, A
    Morel, P
    Mounier, L
    SCIENCE OF COMPUTER PROGRAMMING, 2000, 36 (01) : 27 - 52
  • [26] VeriAbs : Verification by Abstraction and Test Generation
    Afzai, Mohammad
    Asia, A.
    Chauhan, Avriti
    Chimdyalwar, Bharti
    Darke, Priyanka
    Datar, Advaita
    Kumar, Shrawan
    Venkatesh, R.
    34TH IEEE/ACM INTERNATIONAL CONFERENCE ON AUTOMATED SOFTWARE ENGINEERING (ASE 2019), 2019, : 1138 - 1141
  • [27] VeriAbs: Verification by Abstraction and Test Generation
    Darke, Priyanka
    Prabhu, Sumanth
    Chimdyalwar, Bharti
    Chauhan, Avriti
    Kumar, Shrawan
    Basakchowdhury, Animesh
    Venkatesh, R.
    Datar, Advaita
    Medicherla, Raveendra Kumar
    TOOLS AND ALGORITHMS FOR THE CONSTRUCTION AND ANALYSIS OF SYSTEMS, TACAS 2018, PT II, 2018, 10806 : 457 - 462
  • [28] MAESTRO: Automated test generation framework for high test coverage and reduced human effort in automotive industry
    Kim, Yunho
    Lee, Dongju
    Baek, Junki
    Kim, Moonzoo
    INFORMATION AND SOFTWARE TECHNOLOGY, 2020, 123
  • [29] Model Based Generation of High Coverage Test Suites for Embedded Systems
    Ferrante, Orlando
    Ferrari, Alberto
    Marazza, Marco
    2014 19TH IEEE EUROPEAN TEST SYMPOSIUM (ETS 2014), 2014,
  • [30] Coverage Test Technology Based on ONESPIN Verification Platform
    Yang Yawen
    Zhou Shan
    Kong Lu
    2018 INTERNATIONAL CONFERENCE ON ELECTRONICS, COMMUNICATIONS AND CONTROL ENGINEERING (ICECC), 2018, 1026