Spin-polarized low energy electron microscopy of ferromagnetic layers

被引:20
|
作者
Duden, T [1 ]
Bauer, E [1 ]
机构
[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA
来源
JOURNAL OF ELECTRON MICROSCOPY | 1998年 / 47卷 / 05期
关键词
spin-polarized low energy electron microscopy; ferromagnetic layers;
D O I
10.1093/oxfordjournals.jmicro.a023608
中图分类号
TH742 [显微镜];
学科分类号
摘要
Spin-polarized low energy electron microscopy (SPLEEM) is a powerful technique for the study of the magnetic domain structure of ferromagnetic surfaces, thin films and ferromagnetic / nonferromagnetic thin film systems. The unique feature of this instrument is the combination of magnetic with topographic imaging on an atomic depth scale level, and with structural information via low energy electron diffraction (LEED) from submicron regions. These capabilities are illustrated by studies of cobalt layers on W(110), Cu(111) and Au(111) surfaces, of Co-Cu and Co-Au bilayers and of Co/Au/Co and Co/Cu/Co sandwiches.
引用
收藏
页码:379 / 385
页数:7
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