共 50 条
- [1] Nondestructive testing and evaluation of 2D C/SiC with defects Fuhe Cailiao Xuebao/Acta Materiae Compositae Sinica, 2008, 25 (05): : 85 - 90
- [4] Nondestructive defect characterization of SiC substrates and epilayers Journal of Electronic Materials, 2004, 33 : 450 - 455
- [7] Nondestructive testing and analysis of SiC coating on surface of C/SiC composites after oxidation with Micro CT Fuhe Cailiao Xuebao/Acta Materiae Compositae Sinica, 2011, 28 (05): : 126 - 132
- [9] Nondestructive defect characterization of SiC epilayers and its significance for SiC device research SILICON CARBIDE AND RELATED MATERIALS 2003, PTS 1 AND 2, 2004, 457-460 : 601 - 604