Ultrathin organic transistors on oxide surfaces -: art. no. 133

被引:34
|
作者
Daraktchiev, M [1 ]
von Mühlenen, A
Nüesch, F
Schaer, M
Brinkmann, M
Bussac, MN
Zuppiroli, L
机构
[1] Swiss Fed Inst Technol, CH-1015 Lausanne, Switzerland
[2] Inst Charles Sadron, F-67083 Strasbourg, France
[3] Ecole Polytech, Ctr Phys Theor, F-91128 Palaiseau, France
来源
NEW JOURNAL OF PHYSICS | 2005年 / 7卷
关键词
D O I
10.1088/1367-2630/7/1/133
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have built a model organic field-effect transistor that is basically composed of a single layer of pentacene crystal in interaction with an oxide surface. Drain and source contacts are ohmic so that the pentacene layer can carry a current density as high as 3000 A cm-2 at a gate voltage of -60V. Four-probe and two-probe transport measurements as a function of temperature and fields are presented in relation with structural near-field observations. The experimental results suggest a simple two-dimensional model where the equilibrium between free and trapped carriers at the oxide interface determines the OFET characteristics and performance.
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页数:8
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