Reliability growth of a software model under imperfect debugging and generation of errors

被引：7
|
作者：
Zeephongsekul, P
机构：
[1] Dept. of Stat. and Operations Res., Roy. Melbourne Inst. of Technology, Melbourne
来源：
MICROELECTRONICS AND RELIABILITY | 1996年 / 36卷 / 10期
关键词：
D O I：
10.1016/0026-2714(95)00188-3
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, we discuss a software reliability growth model which incorporates imperfect debugging and generation of errors. We show that its trend curve exhibits either an exponential or S-shaped growth depending on a simple condition involving the relative efficiency in error detection between the original errors and errors generated as a consequence of imperfect debugging. Copyright (C) 1996 Elsevier Science Ltd
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页码：1475 / 1482
页数：8
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