Evidence of interface roughness correlation in CdTe/(Cd,Zn)Te quantum wells

被引：0
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作者：
Mayer, EJ
Pelekanos, NT
Kuhl, J
Magnea, N
Mariette, H
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来源：
ULTRAFAST PROCESSES IN SPECTROSCOPY | 1996年
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O433 [光谱学];
学科分类号：
0703 ; 070302 ;
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页码：275 / 277
页数：3
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