Measurement of the complex refractive index of liquids in the terahertz range using ellipsometry

被引：0
|
作者：
Dobroiu, Adrian [1 ]
Otani, Chiko [1 ]
机构：
[1] RIKEN, Sendai, Miyagi, Japan
来源：
35TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ 2010) | 2010年
关键词：
SPECTROSCOPY;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We used ellipsometry to determine the complex index of refraction of liquids in the terahertz range. The method works by allowing a polarized terahertz wave to reflect on the interface between high-resistivity silicon and the liquid sample, and analyzing the polarization state of the reflected wave.
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页数：1
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