Electrical properties of nanocrystalline CeO2-Y2O3 thin films prepared by the sol-gel method

被引:4
|
作者
Yue, HM [1 ]
Liu, ZL
Wang, Y
Yao, KL
机构
[1] Huazhong Univ Sci & Technol, Dept Phys, Wuhan 430074, Peoples R China
[2] Huazhong Univ Sci & Technol, State Key Lab Laser Technol, Wuhan 430074, Peoples R China
[3] Acad Sinica, Int Ctr Mat Phys, Shenyang 110015, Peoples R China
关键词
D O I
10.1023/A:1024591910056
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The nanocrystalline ceria thin films doped with yttria of different concentrations were prepared by using the sol-gel dip-coating method. The complex impedance of the films was measured at various temperatures. It is found that the complex impedance spectroscopies of our nanocrystalline ceria-based thin films show only a residual grain boundary arc, and that the total impedance is increased with an increasing Y3+, concentration and is decreased as the operating temperature is raised.
引用
收藏
页码:720 / 724
页数:5
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