Structural, electrical and magnetic properties of Fe/Si and Fe/FeSi multilayers

被引:0
|
作者
Vávra, I
Bydzovsky, J
Svec, P
Harvanka, M
Dérer, J
Frait, Z
Kambersky, V
Lopusník, R
Visnovsky, S
Kubena, J
Holy, V
机构
[1] Slovak Acad Sci, Inst Elect Engn, SK-84239 Bratislava, Slovakia
[2] Acad Sci Czech Republ, Inst Phys, CZ-18040 Prague, Czech Republic
[3] Charles Univ, Fac Math & Phys, CR-12116 Prague, Czech Republic
[4] Masaryk Univ, Fac Sci, CZ-61137 Brno, Czech Republic
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中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Fe/Si and Fe/FeSi multilayers with various spacer layer thickness (0.8-2.0 nm) were prepared by magnetron sputtering. The detailed structural analysis performed by low angle X-ray scattering and cross-sectional TEM revealed the differences between the microstructure of both kinds of multilayers. Magnetic analysis showed that interlayer exchange coupling is present only in Fe/FeSi multilayers with spacer layer thickness around 1.7 nm.
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页码:743 / 746
页数:4
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