Structure of layered WSe2 thin films with ultralow thermal conductivity

被引：12

作者：

Kim, Seongwon ^{[1
,2
]}

Zuo, Jian Min ^{[1
,2
]}

Nguyen, Ngoc T. ^{[3
]}

Johnson, David C. ^{[3
]}

Cahill, David G. ^{[1
,2
]}

机构：

[1] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA

[2] Univ Illinois, F Seitz Mat Res Lab, Urbana, IL 61801 USA

[3] Univ Oregon, Dept Chem, Eugene, OR 97403 USA

来源：

JOURNAL OF MATERIALS RESEARCH | 2008年 / 23卷 / 04期

关键词：

D O I：

10.1557/JMR.2008.0124

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Crystallographic ordering and defects in WSe(2) thin films with ultralow thermal conductivity are characterized by electron imaging and diffraction in cross-sectional geometry. The results show that the film consists of oriented, coherent crystallites that are a few nanometers in diameter. Two films of different thickness with different thermal conductivity are compared. We show that the film with a lower thermal conductivity is characterized by less coherent crystallites with a greater degree of misorientation.

引用

页码：1064 / 1067

页数：4

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