Online Measurement of Lubricating Film Thickness in Slider-on-Disc Contact Based on Dichromatic Optical Interferometry

被引:12
|
作者
Bai, Qinghua [1 ,2 ]
Guo, Feng [1 ]
Wong, Pat Lam [2 ]
Jiang, Peigang [1 ]
机构
[1] Qingdao Univ Technol, Sch Mech Engn, Qingdao 266520, Peoples R China
[2] City Univ Hong Kong, Dept Mech & Biomed Engn, Hong Kong, Hong Kong, Peoples R China
基金
中国国家自然科学基金;
关键词
Optical interference; Lubricant film thickness; Slider-on-disc contact; Online film thickness measurement; ELASTOHYDRODYNAMIC LUBRICATION; DIFFERENTIAL COLORIMETRY; HYDRODYNAMIC LUBRICATION; OIL FILM; THIN;
D O I
10.1007/s11249-017-0928-3
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
The present study mainly focuses on a new approach to achieve online measurement of lubricating film thickness in a slider-on-disc contact. The inclination of the slider is obtained by Fourier transform and frequency estimation of the interferogram of the sliding contact. An algorithm that is based on optical flow calculation and dynamic time warping technique is presented for tracking a characteristic point with constant film thickness on the 1-D modulated intensity curve. Online film thickness measurement can thus be achieved. This approach has been validated with known gap thickness of a stationary wedge. In addition, transient film thickness under unsteady speeds was measured with the present approach and some lubrication behaviours have been revealed.
引用
收藏
页数:10
相关论文
共 47 条
  • [41] Fast and Reliable Measurement of Thin Film Thickness Profile Based on Wavelet Transform in Spectrally Resolved White-Light Interferometry
    Kim, Min-Gab
    Pahk, Heui-Jae
    INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2018, 19 (02) : 213 - 219
  • [42] Fast and Reliable Measurement of Thin Film Thickness Profile Based on Wavelet Transform in Spectrally Resolved White-Light Interferometry
    Min-Gab Kim
    Heui-Jae Pahk
    International Journal of Precision Engineering and Manufacturing, 2018, 19 : 213 - 219
  • [43] Research of optical fiber sense-based online detection technology of the thickness of offset lithographic dampening film
    Guan, Liming
    Lin, Jian
    Chen, Guojin
    Chen, Mei
    PROCEEDINGS OF THE 2006 IEEE/ASME INTERNATIONAL CONFERENCE ON MECHATRONIC AND EMBEDDED SYSTEMS AND APPLICATIONS, 2006, : 11 - +
  • [44] Non-contact online thickness measurement system for metal films based on eddy current sensing with distance tracking technique
    Li, Wei
    Wang, Hongbo
    Feng, Zhihua
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2016, 87 (04):
  • [45] Newly Developed Method for Liquid Thin Film Thickness Measurement Using Optical Fiber-Based Reflective Probe
    Mizushima, Yuki
    NUCLEAR TECHNOLOGY, 2023, 209 (12) : 1886 - 1897
  • [46] Measurement of ultra low film stress, local stress distribution and flatness by imaging nanotopography based on low coherence phase shifting interferometry in conjunction with wafer and film thickness metrology
    Pravdivtsev, Alexander
    Santos, Manuel, II
    Koo, Ann
    ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES III, 2007, 6672
  • [47] Simultaneous measurement of substrate temperature and thin-film thickness on SiO2/Si wafer using optical-fiber-type low-coherence interferometry
    Ohta, Takayuki
    Koshimizu, Chishio
    Kawasaki, Kanta
    Takeda, Keigo
    Ito, Masafumi
    JOURNAL OF APPLIED PHYSICS, 2009, 105 (01)