Vertical waveguides integrated with silicon photodetectors: Towards high efficiency and low cross-talk image sensors

被引:3
|
作者
Tut, Turgut [1 ]
Dan, Yaping [1 ]
Duane, Peter [1 ,2 ]
Yu, Young [2 ]
Wober, Munib [1 ,2 ]
Crozier, Kenneth B. [1 ]
机构
[1] Harvard Univ, Sch Engn & Appl Sci, Cambridge, MA 02138 USA
[2] Zena Technol Inc, Topsfield, MA 01983 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.3678019
中图分类号
O59 [应用物理学];
学科分类号
摘要
We describe the experimental realization of vertical silicon nitride waveguides integrated with silicon photodetectors. The waveguides are embedded in a silicon dioxide layer. Scanning photocurrent microscopy is performed on a device containing a waveguide, and on a device containing the silicon dioxide layer, but without the waveguide. The results confirm the waveguide's ability to guide light onto the photodetector with high efficiency. We anticipate that the use of these structures in image sensors, with one waveguide per pixel, would greatly improve efficiency and significantly reduce inter-pixel crosstalk. (C) 2012 American Institute of Physics. [doi:10.1063/1.3678019]
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页数:3
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