Behavioral modelling of PROFETTM devices for system-level simulation of mission profiles in automotive environment applications

被引：0

作者：

Simonazzi, Marco ^{[1
]}

Santoro, Danilo ^{[1
]}

Bernardoni, Mirko ^{[2
]}

Delmonte, Nicola ^{[1
]}

Cova, Paolo ^{[1
]}

Menozzi, Roberto ^{[1
]}

机构：

[1] Univ Parma, Dipartimento Ingn & Architettura, Parma, Italy

[2] Infineon Technol Austria, Automot Div, Villach, Austria

来源：

MICROELECTRONICS RELIABILITY | 2021年 / 126卷 / 126期

关键词：

System-level simulation; Behavioral modelling; Automotive devices;

D O I：

10.1016/j.microrel.2021.114324

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work we present a system-simulation approach to model the behavior of PROFETTM devices for automotive applications. Attention has been paid to the simulation speed, given the necessity to simulate long mission profiles in a short amount of time. PLECS has been chosen as a simulation tool, thanks to its system-level approach to the solution of electrical circuits and systems; the work shows how to implement the basic behavioral features described in the PROFETTM datasheet, and how some typical electric features, which would normally be analyzed with a SPICE-like simulator, have been included.

引用

页数：6

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