Retrieving the complex degree of spatial coherence of electron beams

被引：4

作者：

Carrasquilla-Alvarez, J. ^{[2
]}

Castaneda, R. ^{[2
]}

Garcia-Sucerquia, J. ^{[2
,3
]}

Schofield, M. A. ^{[1
]}

Beleggia, M. ^{[1
]}

Zhu, Y. ^{[1
]}

Matteucci, G. ^{[4
]}

机构：

[1] Assoc Univ Inc, Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA

[2] Univ Nacl Colombia, Sch Phys, Medellin, Colombia

[3] Dalhousie Univ, Dept Phys, Halifax, NS B3H 3J5, Canada

[4] Univ Bologna, Dept Phys, I-40127 Bologna, Italy

来源：

OPTIK | 2008年 / 119卷 / 03期

关键词：

D O I：

10.1016/j.ijleo.2006.07.007

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The possibility to characterize the coherence properties of an electron source is presented. The method, based on the determination of centered-reduced moments of the beam spot, allows the evaluation of both amplitude and phase of the complex degree of spatial coherence. The experimental results are in agreement with a different approach based on the Fourier analysis and with calculations according to the Van Cittert-Zernike theorem. (C) 2006 Published by Elsevier GmbH.

引用

页码：127 / 133

页数：7

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