Retrieving the complex degree of spatial coherence of electron beams

被引:4
|
作者
Carrasquilla-Alvarez, J. [2 ]
Castaneda, R. [2 ]
Garcia-Sucerquia, J. [2 ,3 ]
Schofield, M. A. [1 ]
Beleggia, M. [1 ]
Zhu, Y. [1 ]
Matteucci, G. [4 ]
机构
[1] Assoc Univ Inc, Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA
[2] Univ Nacl Colombia, Sch Phys, Medellin, Colombia
[3] Dalhousie Univ, Dept Phys, Halifax, NS B3H 3J5, Canada
[4] Univ Bologna, Dept Phys, I-40127 Bologna, Italy
来源
OPTIK | 2008年 / 119卷 / 03期
关键词
D O I
10.1016/j.ijleo.2006.07.007
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The possibility to characterize the coherence properties of an electron source is presented. The method, based on the determination of centered-reduced moments of the beam spot, allows the evaluation of both amplitude and phase of the complex degree of spatial coherence. The experimental results are in agreement with a different approach based on the Fourier analysis and with calculations according to the Van Cittert-Zernike theorem. (C) 2006 Published by Elsevier GmbH.
引用
收藏
页码:127 / 133
页数:7
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