A creep-damage phase-field model: Predicting topological inversion in Ni-based single crystal superalloys

被引:21
|
作者
Harikrishnan, Rajendran [1 ]
le Graverend, Jean-Briac [1 ]
机构
[1] Texas A&M Univ, Dept Aerosp Engn, College Stn, TX 77843 USA
关键词
Phase field modeling; Continuum damage mechanics; Ni-based single crystal superalloys; Creep-damage; Topological inversion; HIGH-TEMPERATURE CREEP; INTERFACIAL DISLOCATION NETWORKS; NICKEL-BASED SUPERALLOYS; LATTICE MISMATCH; MICROSTRUCTURES; DEFORMATION; DEPENDENCE; KINETICS; BEHAVIOR; RUPTURE;
D O I
10.1016/j.matdes.2018.09.012
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The lifetime of Ni-based single crystal superalloys is connected to the integrity of the strengthening phase, gamma'. Hence, fundamentally understanding and predicting how the mechanical behavior of the gamma' phase softens with the evolution of damage is essential to improve their lifetime predictions. During high-temperature creep, the gamma' phase coalesces, coarsens, and is finally topologically inverted, viz. surrounds the gamma phase and acts as the matrix. The topological inversion comes along with an increase in the plastic strain rate known as the tertiary creep. X-ray tomography experiment has recently revealed that the tertiary creep initiates before the expected increase in the volume fraction of pores. Thus, the initiation of the tertiary creep stage might also be due to the destabilization of the gamma/gamma' interfacial dislocation network leading to the massive shearing of gamma rafts concomitantly resulting in topological inversion. Therefore, to account for microstructural degradation as damage, we proposed a 'macroscopic damage-coupled crystal-plasticity' informed elasticity formulation in phase-field. The predictions from this 'creep-damage phase-field model' agree with the experimental observations; are strikingly similar to the SEM images, and gives a complete microstructural evolution, including topological inversion, leading to further insights about the role of gamma' volume fraction in topological inversion. (C) 2018 Elsevier Ltd. All rights reserved.
引用
收藏
页码:405 / 416
页数:12
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