Evaluation of Null Method for Operational Amplifier Short-Time Testing

被引：0

作者：

Aoki, Riho ^{[1
]}

Katayama, Shogo ^{[1
]}

Sasaki, Yuto ^{[1
]}

Machida, Kosuke ^{[1
]}

Nakatani, Takayuki ^{[1
]}

Wang, Jianlong ^{[1
]}

Kuwana, Anna ^{[1
]}

Hatayama, Kazumi ^{[1
]}

Kobayashi, Haruo ^{[1
]}

Sato, Keno ^{[2
]}

Ishida, Takashi ^{[2
]}

Okamoto, Toshiyuki ^{[2
]}

Ichikawa, Tamotsu ^{[2
]}

机构：

[1] Gunma Univ, Div Elect & Informat, 1-5-1 Tenjin Cho, Kiryu, Gunma 3768515, Japan

[2] ROHM Semicond Co Ltd, Kohoku Ku, 2-4-8 Shin Yokohama, Yokohama, Kanagawa 2220033, Japan

来源：

2019 IEEE 13TH INTERNATIONAL CONFERENCE ON ASIC (ASICON) | 2019年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper investigates the NULL method to apply for the mass production testing of the operational amplifier. The NULL method is widely used to measure the operational amplifier characteristics accurately at the laboratory level, but it takes relatively a long measurement time. Then, we have examined the operation of the NULL method circuit with simulations where the SPICE model provided by the vendor is used for the amplifier under test. Some experiments have been also performed to confirm the agreements to the simulation results. We have found that the proper selection of the compensation capacitor values in the NULL method circuit can lead to short-time and stable testing, which would yield its applicability to the mass production testing.

引用

页数：4

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