High-order birefringence and dispersion measurement using spectroscopic of polarized light

被引：3
|
作者：
Wakayama, T [1 ]
Kowa, H [1 ]
Otani, Y [1 ]
Umeda, N [1 ]
Yoshizawa, T [1 ]
机构：
[1] Tokyo A&T Univ, Tokyo 1848588, Japan
来源：
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN 2001) | 2001年 / 4416卷
关键词：
high-order birefringence measurement spectroscopic interferogram; disperion; acousto-optic tunable filter; FFT;
D O I：
10.1117/12.427032
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This paper describes a method and device for measurement of two-dimensional retardance and dispersion with high-order and azimuthal direction. The system consits of a white light source, crossed polarizers and a detector for spectroscopic polarized light. A spectroscopic interferogram shows sinusoidal to wave number change, and its period changes slightly because of dispersion of birefringence. Fourier transform method is used to analyze the birefringence from the spectroscopic interferogram. One hundred and twenty-eight sets of images are used for birefringence analysis. Some results of 2D birefringence distribution with dispersion are shown for the demonstration.
引用
收藏
页码：23 / 26
页数：4
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