Customized Spherical Near-Field Test Time Reduction for Wireless Base Station Antennas

被引：2

作者：

Almajali, E'qab ^{[1
]}

van Rensburg, Daniel J. ^{[2
]}

McNamara, Derek A. ^{[3
]}

机构：

[1] Univ Sharjah, Dept Elect & Comp Engn, Sharjah 27272, U Arab Emirates

[2] NSI MI Technol, Suwanee, GA 30024 USA

[3] Univ Ottawa, Ottawa, ON K1N 6N5, Canada

来源：

IEEE ANTENNAS AND WIRELESS PROPAGATION LETTERS | 2019年 / 18卷 / 01期

关键词：

Spherical near-field (SNF) testing; test time reduction; wireless base station antennas (BSAs);

D O I：

10.1109/LAWP.2018.2885009

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Effective spherical near-field (SNF) test time reduction approaches are presented for wireless base station antennas that have widely differing beamwidths in the azimuth and elevation planes. The geometry of these antennas allows for the optimization of the SNF angular sampling density by allowing a lower sampling density along one of the acquisition axes. This is validated experimentally and shown to reduce the SNF test time significantly without degrading the measurement accuracy.

引用

页码：172 / 176

页数：5

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