SODIUM-OXYGEN GRAPHITE INTERCALATION COMPOUND : XPS, UPS and STM STUDY

被引：22
|
作者：
Estrade-Szwarckopf, H. [1 ]
Rousseau, B. [1 ]
Herold, C. [2 ]
Lagrange, P. [2 ]
机构：
[1] Univ Orleans, CNRS, UMR 6619, CRMD, F-45071 Orleans 2, France
[2] Univ Nancy 1, CNRS, LCSM, URA 156, F-54506 Vandoeuvre Les Nancy, France
来源：
MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 1998年 / 310卷
关键词：
XPS; UPS; STM; Graphite-Intercalation-Compound; Na-Oxide;
D O I：
10.1080/10587259808045341
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
XPS, UPS and STM are used to characterize a second stage NaO(x)C(y) compound. The charge distribution and the cleavage localization are discussed.
引用
收藏
页码：231 / 236
页数：6
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