As-rich InAs(001)-(2x4) phases investigated by in situ surface x-ray diffraction

被引：3
|
作者：
Tinkham, B. P. [1 ]
Braun, W. [1 ]
Ploog, K. H. [1 ]
Takahasi, M. [2 ]
Mizuki, J. [2 ]
Grosse, F. [3 ]
机构：
[1] Paul Drude Inst Solid State Elect, D-10117 Berlin, Germany
[2] Japan Atom Energy Agcy, Synchrotron Radiat Res Ctr, Mikazuki, Hyogo 6795148, Japan
[3] Humboldt Univ, Inst Phys, D-12489 Berlin, Germany
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2008年 / 26卷 / 04期
关键词：
D O I：
10.1116/1.2918314
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Surface x-ray diffraction has been employed, in situ, to measure InAs(001)-(2x4) surface phases under technologically relevant growth conditions. For the As-rich (2x4) phase, the authors obtain good agreement between the data and the beta 2(2x4) surface reconstruction model. Comparison of our measurements on the (2x4) phase measured close to the metal-rich phase transition to models from density functional theory suggests a mixture of alpha 2(2x4) and beta 2(2x4) surface structures present on the surface. (C) 2008 American Vacuum Society.
引用
收藏
页码：1516 / 1520
页数：5
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