Calculation of vertical and horizontal mobilities in InAs/GaSb superlattices

被引:31
|
作者
Szmulowicz, F. [1 ]
Haugan, H. J. [2 ]
Elhamri, S. [3 ]
Brown, G. J. [4 ]
机构
[1] Univ Dayton, Res Inst, Dayton, OH 45469 USA
[2] Universal Technol Corp, Dayton, OH 45432 USA
[3] Univ Dayton, Dept Phys, Dayton, OH 45469 USA
[4] USAF, Mat & Mfg Directorate, Res Lab, Wright Patterson AFB, OH 45433 USA
关键词
INTERFACE-ROUGHNESS SCATTERING; SEMICONDUCTOR SUPERLATTICES; ELECTRONIC-PROPERTIES; ALLOY SCATTERING; TRANSPORT; WAVELENGTH; PHOTODIODES; MAGNETOTRANSPORT; PASSIVATION; DEPENDENCE;
D O I
10.1103/PhysRevB.84.155307
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Superlattice (SL) devices such as infrared detectors and quantum-cascade lasers rely on efficient transport of carriers perpendicular to the SL layers by drift and/or diffusion. While horizontal mobilities are measured routinely, measurements of perpendicular-carrier mobilities require nonstandard experimental techniques such as the geometric magneto-resistance. Here we show how perpendicular mobilities can be estimated from horizontal mobility measurements and calculated mobilities. We treat low-temperature horizontal and vertical transport in SL on an equal footing by calculating both mobilities using the same interface roughness scattering (IRS) model from a rigorous solution of the Boltzmann transport equation. The calculation is specialized to the case of InAs/GaSb SLs, which are of current interest in the development of third-generation infrared detector focal plane arrays. The results are compared to available data.
引用
收藏
页数:14
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