Simulation of carbon nanotube FET's including hot-phonon and self-heating effects

被引:31
|
作者
Hasan, Sayed [1 ]
Alam, Muhammad Ashraful
Lundstrom, Mark S.
机构
[1] Texas Instruments Inc, Silicon Technol Dev Grp, Dallas, TX 75243 USA
[2] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
关键词
Boltzmann Transport Equation (BTE); carbon nanotube; electron-phonon interaction; hot-phonon effects; joule-heating effects; phonon scattering; transistor;
D O I
10.1109/TED.2007.903291
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effects of the nonequilibrium population of optical phonon (hot-phonon effect) and acoustic phonon (self-heating effect) on the dc performance of carbon nanotube (CNT) MOSFET are examined by solving coupled semiclassical electron and phonon transport equations. In this paper, the numerical solution of these coupled transport equations is described. Full-band electron and phonon Boltzmann transport equations are solved to simulate the electron and phonon transport. Electron-phonon scattering rates are calculated using the tight-binding approach and the phonon-phonon scattering by relaxation time approximation (optical phonon relaxation time extracted by fitting the measured data of metallic tube). We show that the dc ballisticity of a CNT MOSFET degrades by approximately 10% due to hot-phonon effects, which is a much smaller degradation compared to two-terminal measurement of metallic tubes. Self-heating of the tube is also examined and is found to be insignificant for a single-tube transistor.
引用
收藏
页码:2352 / 2361
页数:10
相关论文
共 50 条
  • [21] Self-Heating Influence on Hot Carrier Degradation Reliability of GAA FET by 3D KMC
    Zhao, Songhan
    Zhao, Pan
    He, Yandong
    Du, Gang
    2023 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, SISPAD, 2023, : 101 - 104
  • [22] Analysis and simulation of self-heating effects on RE LDMOS devices
    Belaïd, MA
    Ketata, K
    Maanane, H
    Gares, M
    Mourgues, K
    Marcon, J
    SISPAD: 2005 International Conference on Simulation of Semiconductor Processes and Devices, 2005, : 231 - 234
  • [23] Ballistic phonon transport and self-heating effects in strained-silicon transistors
    Etessam-Yazdani, Keivan
    Yang, Yizhang
    Asheghi, Mehdi
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2006, 29 (02): : 254 - 260
  • [24] Numerical simulation of semiconductor devices considering self-heating effects
    Hao, M
    Tian, LL
    Yu, ZP
    1998 5TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY PROCEEDINGS, 1998, : 472 - 476
  • [25] Hardware validated TCAD Simulation of Polysilicon resistor including trap physics and self-heating
    Adari, Rama Bhadra Rao
    Suresh, Satya
    Prabhu, R. D.
    2012 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID STATE CIRCUIT (EDSSC), 2012,
  • [26] Characterization and modelling of power RF LDMOS transistor including self-heating effects
    Belaid, MA
    Maanane, H
    Mourgues, K
    Masmoudi, M
    Ketata, K
    Marcon, J
    16TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, 2004, : 262 - 265
  • [27] Analysis of RF performances of GaN MESFETs including self-heating and trapping effects
    Islam, SS
    Anwar, AFM
    2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2003, : 459 - 462
  • [28] Thermal stability investigation of power GaN HEMT including self-heating effects
    Aouf, A.
    Djeffal, F.
    Douak, F.
    2017 6TH INTERNATIONAL CONFERENCE ON SYSTEMS AND CONTROL (ICSC' 17), 2017, : 451 - 454
  • [29] A New Compact Model for AlGaN/GaN HEMTs Including Self-Heating Effects
    Wen, Zhang
    Xu, Yuehang
    Wu, Qingzhi
    Zhang, Yong
    Xu, Ruimin
    Yan, Bo
    2017 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), 2017, : 248 - 251
  • [30] Deterministic Boltzmann Equation Solver for Graphene Sheets Including Self-Heating Effects
    Hong, Sung-Min
    Cha, Suhyeong
    2016 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD), 2016, : 197 - 200