Vertical tracks on the sidewall of a silicon die using 3D holographic photolithography

被引:8
|
作者
Toriz-Garcia, J. J. [1 ]
Williams, G. L. [1 ]
McWilliam, R. [2 ]
Seed, N. L. [1 ]
Purvis, A. [2 ]
Soulard, F. B. [2 ]
Cowling, J. J. [2 ]
Ivey, P. A. [3 ]
机构
[1] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
[2] Univ Durham, Sch Engn & Comp Sci, Durham DH1 3LE, England
[3] Innotec Ltd, Calver S32 3YZ, Hope Valley, England
基金
英国工程与自然科学研究理事会;
关键词
PHOTORESIST;
D O I
10.1088/0960-1317/21/8/085034
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We describe the patterning of multiple 10 mu m wide conductive tracks down the vertical sidewall of a 500 mu m thick silicon die. A novel photolithographic technique is used, which utilizes a computer-generated hologram mask in conjunction with a diffraction grating. 3D holographic photolithography is a powerful method for eliminating the troublesome diffractive line broadening that is usually encountered when patterning non-planar substrates. When used in conjunction with a diffraction grating, it creates the possibility to pattern fine features onto vertical surfaces-an achievement outside the normal realm of photolithography. The technique has many potential applications in MEMS, microsystem integration and packaging.
引用
收藏
页数:6
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