Rapid diagnostics of an ASIC IP block using dynamic laser scanning

被引：1
|
作者：
Liao, JY [1 ]
Chen, XD [1 ]
Marks, HL [1 ]
Nishizaki, C [1 ]
Woods, GL [1 ]
Vedagarbha, P [1 ]
Nataraj, N [1 ]
机构：
[1] NVIDIA Corp, Santa Clara, CA 95050 USA
来源：
IPFA 2005: Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits | 2005年
关键词：
D O I：
10.1109/IPFA.2005.1469125
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：27 / 31
页数：5
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