Measurement and compensation of misalignment in double-sided hard X-ray Fresnel zone plates

被引:2
|
作者
Yurgens, Viktoria [1 ,3 ]
Koch, Frieder [1 ]
Scheel, Mario [2 ]
Weitkamp, Timm [2 ]
David, Christian [1 ]
机构
[1] Paul Scherrer Inst, CH-4056 Villigen, Switzerland
[2] Synchrotron SOLEIL, Gif Sur Yvette 91192, France
[3] Univ Basel, Klingelbergstr 82, Basel, Switzerland
关键词
X-ray optics; Fresnel zone plate; diffraction efficiency; microfocus X-ray source; EFFICIENCY; STACKING; OPTICS; FIELD;
D O I
10.1107/S1600577520001757
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Double-sided Fresnel zone plates are diffractive lenses used for high-resolution hard X-ray microscopy. The double-sided structures have significantly higher aspect ratios compared with single-sided components and hence enable more efficient imaging. The zone plates discussed in this paper are fabricated on each side of a thin support membrane, and the alignment of the zone plates with respect to each other is critical. Here, a simple and reliable way of quantifying misalignments by recording efficiency maps and measuring the absolute diffraction efficiency of the zone plates as a function of tilting angle in two directions is presented. The measurements are performed in a setup based on a tungsten-anode microfocus X-ray tube, providing an X-ray energy of 8.4 keV through differential measurements with a Cu and an Ni filter. This study investigates the sources of the misalignments and concludes that they can be avoided by decreasing the structure heights on both sides of the membrane and by pre-programming size differences between the front- and back-side zone plates.
引用
收藏
页码:583 / 589
页数:7
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