Measurement of Complex Permittivity of Anisotropic Dielectric Spheres

被引：0
|
作者：
Cuenca, Daniel Lopez [1 ]
Dudi, Rajpal [1 ]
Hesselbarth, Jan [1 ]
机构：
[1] Univ Stuttgart, Pfaffenwaldring 47, D-70569 Stuttgart, Germany
来源：
2016 GERMAN MICROWAVE CONFERENCE (GEMIC) | 2016年
关键词：
anisotropic dielectric sphere; spherical resonator;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new concept to measure the dielectric properties of anisotropic spheres at microwave frequency is presented. First, the sphere is placed in a parallel-plate microstrip structure. The anisotropic axis of the sphere is determined in a three-step process. Then, sphere is placed in a rectangular waveguide cavity resonator, where resonance modes of the sphere are excited and subsequently modeled in a field simulation tool. Simulations are matched with measurements by fitting the anisotropic complex permittivity parameters. The procedure is illustrated by determining the anisotropic axis and measuring the anisotropic complex permittivity of a sapphire sphere of 10 mm diameter.
引用
收藏
页码：461 / 464
页数：4
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