Modeling Methods of the Test Inputs for Analysis the Digital Devices

被引：0
|
作者：
Melnik, Vladimir I. [1 ]
Mikhailov, Alexander N. [1 ]
Grishkin, Valery M. [2 ]
Ovsyannikov, Dmitri A. [2 ]
Yelaev, Yevgeny V. [2 ]
机构：
[1] Open Joint Stock Co Avangard, St Petersburg, Russia
[2] St Petersburg State Univ, St Petersburg 199034, Russia
来源：
2014 2ND INTERNATIONAL CONFERENCE ON EMISSION ELECTRONICS (ICEE) | 2014年
关键词：
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) "SimTest" was developed so as to automate the process of digital device test-program making.
引用
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页码：48 / 50
页数：3
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