Modeling Methods of the Test Inputs for Analysis the Digital Devices

被引：0

作者：

Melnik, Vladimir I. ^{[1
]}

Mikhailov, Alexander N. ^{[1
]}

Grishkin, Valery M. ^{[2
]}

Ovsyannikov, Dmitri A. ^{[2
]}

Yelaev, Yevgeny V. ^{[2
]}

机构：

[1] Open Joint Stock Co Avangard, St Petersburg, Russia

[2] St Petersburg State Univ, St Petersburg 199034, Russia

来源：

2014 2ND INTERNATIONAL CONFERENCE ON EMISSION ELECTRONICS (ICEE) | 2014年

关键词：

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) "SimTest" was developed so as to automate the process of digital device test-program making.

引用

页码：48 / 50

页数：3

共 50 条

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