HRTEM and nanoprobe study of nanocomposite Fe-Pt films

被引:0
|
作者
Liu, Y [1 ]
Liu, JP [1 ]
Sellmyer, DJ [1 ]
机构
[1] Univ Nebraska, Ctr Mat Res & Anal, Lincoln, NE 68588 USA
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:305 / 306
页数:2
相关论文
共 50 条
  • [21] ORDERING IN FE-PT ALLOYS
    VLASOVA, YN
    SAPOZHKO.PT
    PHYSICS OF METALS AND METALLOGRAPHY-USSR, 1970, 30 (05): : 85 - &
  • [22] Interdiffusion in the Fe-Pt System
    Sangeeta Santra
    Avik Mondal
    Aloke Paul
    Metallurgical and Materials Transactions A, 2012, 43 : 791 - 795
  • [23] Interdiffusion in Fe-Pt multilayers
    Zotov, Nikolay
    Feydt, Jürgen
    Savan, Alan
    Ludwig, Alfred
    Journal of Applied Physics, 2006, 100 (07):
  • [24] Effect of Microstructure Refinement on Magnetic Properties of Fe-Pt Thin Films
    Yuan, F. T.
    Huang, H. W.
    Chang, H. W.
    Wei, D. H.
    Chen, S. K.
    Yao, Y. D.
    IEEE TRANSACTIONS ON MAGNETICS, 2008, 44 (11) : 4195 - 4198
  • [25] Study of the Magnetic Phase of Fe-Pt Alloy Nanoparticles
    Cha, Hyungil
    Kim, Younghwan
    Kim, Changwoo
    Kang, Youngsoo
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2008, 8 (09) : 4666 - 4669
  • [27] Structures and magnetic properties of isotropic nanostructured Fe-Pt thin films
    Wang, Yi-Zhong
    Zhang, Mao-Cai
    Qiao, Yi
    Wang, Jin
    Wang, Yin-Jun
    Shen, Bao-Gen
    Hu, Bo-Ping
    Wuli Xuebao/Acta Physica Sinica, 2000, 49 (08): : 1604 - 1605
  • [28] Structures and magnetic properties of isotropic nanostructured Fe-Pt thin films
    Wang, YZ
    Zhang, MC
    Qiao, Y
    Wang, J
    Wang, YJ
    Shen, BG
    Hu, BP
    ACTA PHYSICA SINICA, 2000, 49 (08) : 1600 - 1605
  • [29] Phase transformation and magnetic hardening in electrodeposited, equiatomic Fe-Pt films
    Liang, Defu
    Mallett, Jonathan J.
    Zangari, Giovanni
    ELECTROCHIMICA ACTA, 2010, 55 (27) : 8100 - 8104
  • [30] Magnetic anisotropy and magnetotransport properties of nanostructured Fe-Pt thin films
    Georgescu, V
    Ilioaia, C
    Musat, R
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2005, 7 (06): : 3063 - 3067