An outlook for high-resolution UV photoelectron spectroscopy of solids at low temperature

被引：32
|
作者：
Purdie, D [1 ]
Hengsberger, M [1 ]
Garnier, M [1 ]
Baer, Y [1 ]
机构：
[1] Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland
来源：
SURFACE SCIENCE | 1998年 / 407卷 / 1-3期
关键词：
angle-resolved photoemission; copper; low index single crystal surfaces; radiation damage; surface electronic phenomena;
D O I：
10.1016/S0039-6028(98)00275-1
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
In this paper we use Cu(100) to discuss the relevance of surface quality and stability to high resolution photoemission spectroscopy. Particular emphasis is placed on experiments performed at low temperature. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：L671 / L675
页数：5
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