An Abnormal Information Collection Protocol for Large-Scale RFID Systems

Many technologies have become mature for RFID applications, but few studies have been carried out to collect large-scale RFID tags information. This paper focuses on the problem of abnormal information collection, which aims at effectively identifying the abnormal products through sensor information detection in large storage, so that it can be processed in a timely manner. In order to reduce the cost of transmission and improve the efficiency of recognition, an abnormal information collection protocol (AIC) is presented, which first randomly collects part of tags information, and estimates the number of tags that are detected as abnormal, then collects their ID number and sensor information. Through the experiment simulation, AIC can efficiently collects the abnormal tags information, and is better than the Gen2-based protocol, SIC and MIC protocols based on the bloom filter.