Multivariate statistical analysis of non-mass-selected ToF-SIMS data

被引:12
|
作者
Smentkowski, V. S. [1 ]
Ostrowski, S. G. [1 ]
Kollmer, F. [2 ]
Schnieders, A. [3 ]
Keenan, M. R. [4 ]
Ohlhausen, J. A. [4 ]
Kotula, P. G. [4 ]
机构
[1] Global Res, Gen Elect, Niskayuna, NY 12309 USA
[2] ION TOF GmbH, Munster, Germany
[3] TASCON USA Inc, Chestnut Ridge, NY 10977 USA
[4] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
ToF-SIMS; multivariate statistical analysis; chemometrics; LMIG; cluster;
D O I
10.1002/sia.2862
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Cluster LMIGs are now regarded as the standard primary ion guns on time-of-flight secondary ion mass spectrometers (ToF-SIMS). The ToF-SIMS analyst typically selects a bombarding species (cluster size and charge) to be used for material analysis. Using standard data collection protocols where the analyst uses only a single primary bombarding species, only a fraction of the ion-beam current generated by the LMIG is used. In this work, we demonstrate for the first time that it is possible to perform ToF-SIMS analysis when all of the primary ion intensity (clusters) are used; we refer to this new data analysis mode as non-mass-selected (NMS) analysis. Since each of the bombarding species has a different mass-to-charge ratio, they strike the sample at different times, and as a result, each of the bombarding species generates a spectrum. The resulting NMS ToF-SIMS spectrum contains contributions from each of the bombarding species that are shifted in time. NMS spectra are incredibly complicated and would be difficult, if not impossible, to analyze using univariate methodology. We will demonstrate that automated multivariate statistical analysis (MVSA) tools are capable of rapidly converting the complicated NMS data sets into a handful of chemical components (represented by both spectra and images) that are easier to interpret since each component spectrum represents a unique and simpler chemistry. Copyright (C) 2008 John Wiley & Sons, Ltd.
引用
收藏
页码:1176 / 1182
页数:7
相关论文
共 50 条
  • [21] Mass accuracy- TOF-SIMS
    Green, F. M.
    Gilmore, I. S.
    Seah, M. P.
    APPLIED SURFACE SCIENCE, 2006, 252 (19) : 6591 - 6593
  • [22] Unsupervised Analysis of Big ToF-SIMS Data Sets: a Statistical Pattern Recognition Approach
    Tuccitto, Nunzio
    Capizzi, Giacomo
    Torrisi, Alberto
    Licciardello, Antonino
    ANALYTICAL CHEMISTRY, 2018, 90 (04) : 2860 - 2866
  • [23] Perfluoropolyethers: Analysis by TOF-SIMS
    Spool, AM
    Kasai, PH
    MACROMOLECULES, 1996, 29 (05) : 1691 - 1697
  • [24] TOF-SIMS analysis of polymers
    Wien, Karl
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1997, 131 (1-4): : 38 - 54
  • [25] TOF-SIMS analysis of polymers
    Wien, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 131 (1-4): : 38 - 54
  • [26] Accounting for Poisson noise in the multivariate analysis of ToF-SIMS spectrum images
    Keenan, MR
    Kotula, PG
    SURFACE AND INTERFACE ANALYSIS, 2004, 36 (03) : 203 - 212
  • [27] Explanatory multivariate analysis of ToF-SIMS spectra for the discrimination of bacterial isolates
    Vaidyanathan, Seetharaman
    Fletcher, John S.
    Jarvis, Roger M.
    Henderson, Alex
    Lockyer, Nicholas P.
    Goodacre, Royston
    Vickerman, John C.
    ANALYST, 2009, 134 (11) : 2352 - 2360
  • [28] ToF-SIMS imaging of PE/PP polymer using multivariate analysis
    Miyasaka, Toyomitsu
    Ikemoto, Takashi
    Kohno, Teiichiro
    APPLIED SURFACE SCIENCE, 2008, 255 (04) : 1576 - 1579
  • [29] Multivariate ToF-SIMS image analysis of polymer microarrays and protein adsorption
    Hook, Andrew L.
    Williams, Philip M.
    Alexander, Morgan R.
    Scurr, David J.
    BIOINTERPHASES, 2015, 10 (01)
  • [30] ToF-SIMS analysis of iron oxide particle oxidation by isotopic and multivariate analysis
    Ohlhausen, James A.
    Coker, Eric N.
    Ambrosini, Andrea
    Miller, James E.
    SURFACE AND INTERFACE ANALYSIS, 2013, 45 (01) : 320 - 323